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Monday, August 10, 2020 | History

1 edition of Proceedings of the symposia on reliability of semiconductor devices and interconnection and multilevel metallization, interconnection, and contact technologies found in the catalog.

Proceedings of the symposia on reliability of semiconductor devices and interconnection and multilevel metallization, interconnection, and contact technologies

Proceedings of the symposia on reliability of semiconductor devices and interconnection and multilevel metallization, interconnection, and contact technologies

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Published by Electrochemical Society in Pennington, NJ (10 S. Main St., Pennington 08534-2896) .
Written in English

    Subjects:
  • Semiconductors -- Reliability -- Congresses.,
  • Integrated circuits -- Very large scale integration -- Design and construction -- Congresses.,
  • Metallizing -- Congresses.

  • Edition Notes

    Other titlesReliability of semiconductor devices and interconnection and multilevel metallization, interconnection, and contact technologies.
    Statementedited by Harzara S. Rathore, Geraldine C. Schwartz, Robin A. Susko ; [sponsored by] Dielectrics and Insulation and Electronics divisions.
    SeriesProceedings ;, v. 89-6, Proceedings (Electrochemical Society) ;, v. 89-6.
    ContributionsRathore, Harzara S., Schwartz, G. C., Susko, R. A., Electrochemical Society. Dielectrics and Insulation Division., Electrochemical Society. Electronics Division.
    Classifications
    LC ClassificationsTK7871.85 .P7485 1989
    The Physical Object
    Paginationviii, 495 p. :
    Number of Pages495
    ID Numbers
    Open LibraryOL2230175M
    LC Control Number89083803


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